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  • 1-4 of  4 results for ""Ugwiri, Moise Avoci""
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Conference

A New Technique for Optimization of Linear Displacement Measurement based on MEMS Accelerometer

  • Source: 2020 International Semiconductor Conference (CAS) Semiconductor Conference (CAS), 2020 International. :155-158 Oct, 2020

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Academic Journal

SAR sensors measurements for environmental classification: Machine learning-based performances

  • Source: IEEE Instrumentation & Measurement Magazine IEEE Instrum. Meas. Mag. Instrumentation & Measurement Magazine, IEEE. 23(6):23-30 Sep, 2020

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Academic Journal

Vibrations for fault detection in electric machines

  • Source: IEEE Instrumentation & Measurement Magazine IEEE Instrum. Meas. Mag. Instrumentation & Measurement Magazine, IEEE. 23(1):66-72 Feb, 2020

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Conference

Modeling Stresses in Plasmonic Nanosensors

  • Source: 2019 5th International Conference on Nanotechnology for Instrumentation and Measurement (NanofIM) Nanotechnology for Instrumentation and Measurement (NanofIM), 2019 5th International Conference on.

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  • 1-4 of  4 results for ""Ugwiri, Moise Avoci""