Heuristic Methods for Fine-Grain Exploitation of FDSOI

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  • Additional Information
    • Publication Information:
      USA: IEEE
    • Publication Date:
      2020
    • Abstract:
      Fully depleted silicon on insulator (FDSOI) is attractive for its low cost and low power; the mixed-Vt and body-bias levers that it affords expand the performance-power solution space. However, in FDSOI, different-Vt (i.e., low Vt and regular Vt) devices must be isolated from each other, which makes realization of fine-grained mixed-Vt/body-biasing in layout extremely challenging. In this article, we study heuristic methods aimed at exploitation of fine-grained mixed-Vt in FDSOI implementation. We propose a novel speed domain partitioning (SDP) problem formulation that comprehends the spatial contiguity restrictions arising from flip-well structure of low Vt regions in popular 28-nm commercial FDSOI offerings. We explore a wide space of implementation flows that include an integer linear programming (ILP)-based approach, and a heuristic (sensitivity-based) optimization. Our experimental studies have been performed across multiple commercial enablements. We observe that outcomes are library- and design-dependent. For implementations using generic library options, up to 20% speed improvement with 54% low Vt region is seen for one out of four testcases studied. For implementations using “rich” library options, up to 7% speed improvement with 26% low Vt region is achieved. We provide a discussion that summarizes root-cause, intrinsic difficulties of fine-grained exploitation of mixed-Vt. Finally, we suggest a “decision tree” to help assess a design’s amenability to fine-grained mixed-Vt implementation, and to help guide design flow selection for better design QoR.
    • Author Affiliations:
      NXP Semiconductors, San Jose, CA, USA
      Department of Computer Science and Engineering, University of California at San Diego, San Diego, CA, USA
      Department of Electrical and Computer Engineering, University of California at San Diego, San Diego, CA, USA
    • ISSN:
      0278-0070
      1937-4151
    • Accession Number:
      10.1109/TCAD.2019.2935053
    • Rights:
      Copyright 1982-2012, IEEE
    • AMSID:
      8796415
    • Date of Current Version:
      2020
    • Document Subtype:
      IEEE Transaction
    • Sponsored by:
      IEEE Council on Electronic Design Automation
    • Accession Number:
      edseee.8796415
  • Citations
    • ABNT:
      FATEMI, H. et al. Heuristic Methods for Fine-Grain Exploitation of FDSOI. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst, [s. l.], v. 39, n. 10, p. 2860–2871, 2020. DOI 10.1109/TCAD.2019.2935053. Disponível em: http://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.8796415. Acesso em: 1 dez. 2020.
    • AMA:
      Fatemi H, Kahng AB, Lee H, Pineda de Gyvez J. Heuristic Methods for Fine-Grain Exploitation of FDSOI. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans Comput-Aided Des Integr Circuits Syst. 2020;39(10):2860-2871. doi:10.1109/TCAD.2019.2935053
    • APA:
      Fatemi, H., Kahng, A. B., Lee, H., & Pineda de Gyvez, J. (2020). Heuristic Methods for Fine-Grain Exploitation of FDSOI. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst, 39(10), 2860–2871. https://doi.org/10.1109/TCAD.2019.2935053
    • Chicago/Turabian: Author-Date:
      Fatemi, H., A.B. Kahng, H. Lee, and J. Pineda de Gyvez. 2020. “Heuristic Methods for Fine-Grain Exploitation of FDSOI.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst 39 (10): 2860–71. doi:10.1109/TCAD.2019.2935053.
    • Harvard:
      Fatemi, H. et al. (2020) ‘Heuristic Methods for Fine-Grain Exploitation of FDSOI’, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst, 39(10), pp. 2860–2871. doi: 10.1109/TCAD.2019.2935053.
    • Harvard: Australian:
      Fatemi, H, Kahng, AB, Lee, H & Pineda de Gyvez, J 2020, ‘Heuristic Methods for Fine-Grain Exploitation of FDSOI’, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst, vol. 39, no. 10, pp. 2860–2871, viewed 1 December 2020, .
    • MLA:
      Fatemi, H., et al. “Heuristic Methods for Fine-Grain Exploitation of FDSOI.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst, vol. 39, no. 10, Oct. 2020, pp. 2860–2871. EBSCOhost, doi:10.1109/TCAD.2019.2935053.
    • Chicago/Turabian: Humanities:
      Fatemi, H., A.B. Kahng, H. Lee, and J. Pineda de Gyvez. “Heuristic Methods for Fine-Grain Exploitation of FDSOI.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst 39, no. 10 (October 1, 2020): 2860–71. doi:10.1109/TCAD.2019.2935053.
    • Vancouver/ICMJE:
      Fatemi H, Kahng AB, Lee H, Pineda de Gyvez J. Heuristic Methods for Fine-Grain Exploitation of FDSOI. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans Comput-Aided Des Integr Circuits Syst [Internet]. 2020 Oct 1 [cited 2020 Dec 1];39(10):2860–71. Available from: http://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.8796415