Compendium of single event effects test results for commercial-off-the-shelf and standard electronics for low earth orbit and deep space applications

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  • Additional Information
    • Publication Information:
      IEEE
    • Publication Date:
      2017
    • Abstract:
      We present the results of Single Event Effects (SEE) testing with high energy protons and with low and high energy heavy ions for electrical components considered for Low Earth Orbit (LEO) and for deep space applications.
    • Contents Note:
      Conference Acronym: NSREC
    • Author Affiliations:
      Contributors from Lockheed Martin Space Systems Company, Houston, Texas, 77058
    • ISBN:
      978-1-5386-3750-0
      978-1-5090-4647-8
    • ISSN:
      2154-0535
    • Relation:
      2017 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2017)
    • Accession Number:
      10.1109/NSREC.2017.8115433
    • Rights:
      Copyright 2017, IEEE
    • AMSID:
      8115433
    • Conference Acronym:
      NSREC
    • Date of Current Version:
      2017
    • Document Subtype:
      IEEE Conference
    • Notes:
      Conference Location: New Orleans, LA, USA, USA

      Conference Start Date: 17 July 2017

      Conference End Date: 21 July 2017
    • Accession Number:
      edseee.8115433
  • Citations
    • ABNT:
      REDDELL, B. D. et al. Compendium of single event effects test results for commercial-off-the-shelf and standard electronics for low earth orbit and deep space applications. 2017 IEEE Radiation Effects Data Workshop (REDW), Radiation Effects Data Workshop (REDW), 2017 IEEE, [s. l.], p. 1–6, 2017. DOI 10.1109/NSREC.2017.8115433. Disponível em: http://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.8115433. Acesso em: 10 ago. 2020.
    • AMA:
      Reddell BD, Bailey CR, O’Neill PM, et al. Compendium of single event effects test results for commercial-off-the-shelf and standard electronics for low earth orbit and deep space applications. 2017 IEEE Radiation Effects Data Workshop (REDW), Radiation Effects Data Workshop (REDW), 2017 IEEE. July 2017:1-6. doi:10.1109/NSREC.2017.8115433
    • APA:
      Reddell, B. D., Bailey, C. R., O’Neill, P. M., Nguyen, K. V., Wheeler, S. A., Gaza, R., Patel, C., Cooper, J., Kalb, T., Beach, E., & Mason, L. (2017). Compendium of single event effects test results for commercial-off-the-shelf and standard electronics for low earth orbit and deep space applications. 2017 IEEE Radiation Effects Data Workshop (REDW), Radiation Effects Data Workshop (REDW), 2017 IEEE, 1–6. https://doi.org/10.1109/NSREC.2017.8115433
    • Chicago/Turabian: Author-Date:
      Reddell, Brandon D., Charles R. Bailey, Patrick M. O’Neill, Kyson V. Nguyen, Scott A. Wheeler, Razvan Gaza, Chirag Patel, et al. 2017. “Compendium of Single Event Effects Test Results for Commercial-off-the-Shelf and Standard Electronics for Low Earth Orbit and Deep Space Applications.” 2017 IEEE Radiation Effects Data Workshop (REDW), Radiation Effects Data Workshop (REDW), 2017 IEEE, July, 1–6. doi:10.1109/NSREC.2017.8115433.
    • Harvard:
      Reddell, B. D. et al. (2017) ‘Compendium of single event effects test results for commercial-off-the-shelf and standard electronics for low earth orbit and deep space applications’, 2017 IEEE Radiation Effects Data Workshop (REDW), Radiation Effects Data Workshop (REDW), 2017 IEEE, pp. 1–6. doi: 10.1109/NSREC.2017.8115433.
    • Harvard: Australian:
      Reddell, BD, Bailey, CR, O’Neill, PM, Nguyen, KV, Wheeler, SA, Gaza, R, Patel, C, Cooper, J, Kalb, T, Beach, E & Mason, L 2017, ‘Compendium of single event effects test results for commercial-off-the-shelf and standard electronics for low earth orbit and deep space applications’, 2017 IEEE Radiation Effects Data Workshop (REDW), Radiation Effects Data Workshop (REDW), 2017 IEEE, pp. 1–6, viewed 10 August 2020, .
    • MLA:
      Reddell, Brandon D., et al. “Compendium of Single Event Effects Test Results for Commercial-off-the-Shelf and Standard Electronics for Low Earth Orbit and Deep Space Applications.” 2017 IEEE Radiation Effects Data Workshop (REDW), Radiation Effects Data Workshop (REDW), 2017 IEEE, July 2017, pp. 1–6. EBSCOhost, doi:10.1109/NSREC.2017.8115433.
    • Chicago/Turabian: Humanities:
      Reddell, Brandon D., Charles R. Bailey, Patrick M. O’Neill, Kyson V. Nguyen, Scott A. Wheeler, Razvan Gaza, Chirag Patel, et al. “Compendium of Single Event Effects Test Results for Commercial-off-the-Shelf and Standard Electronics for Low Earth Orbit and Deep Space Applications.” 2017 IEEE Radiation Effects Data Workshop (REDW), Radiation Effects Data Workshop (REDW), 2017 IEEE, July 1, 2017, 1–6. doi:10.1109/NSREC.2017.8115433.
    • Vancouver/ICMJE:
      Reddell BD, Bailey CR, O’Neill PM, Nguyen KV, Wheeler SA, Gaza R, et al. Compendium of single event effects test results for commercial-off-the-shelf and standard electronics for low earth orbit and deep space applications. 2017 IEEE Radiation Effects Data Workshop (REDW), Radiation Effects Data Workshop (REDW), 2017 IEEE [Internet]. 2017 Jul 1 [cited 2020 Aug 10];1–6. Available from: http://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.8115433